The Dr. Schenk I-V Curve Tracer is the ideal solution for high-speed, non-destructive measurement of I-V curves of thin-film modules prior to the lamination step. It can evaluate the electrical characteristics of every individual cell on the complete thinfilm panel and detect local variations. more
This stand-alone measurement solution test the electrical insulation between the solar cells after scribing. The system detects shorts and minimum resistance between neighboring cells. more
Based on a high resolution matrix camera the Microscope Station has been developed as measurement solution focusing on the width and distance between scribe lines. more
Dr. Schenk's Haze or Light Trapping Monitoring option has been developed in order to check the layer structure of incoming TCO coated glass. more
This add-on option to thin film module inspection measures the sheet resistance of the solar panel's substrate coating. more
With this innovative option PV manufacturers can monitor local thickness variations after layer deposition steps covering the entire panel area. It supports the control of the coating process. more
As measurement update for SolarInspect this system measures length, width and right angularity of the glass panels at the beginning of the production line. more

Dr. Schenk Metrology System

OPV is one of the most promising future technologies in the PV industry.[more]

Look for the Schenk booth at conferences and trade shows 2012

Dr. Schenk is happy to welcome you to conferences and trade shows all around the world. Talk to the...[more]


Dr. Schenk Metrology System

OPV is one of the most promising future technologies in the PV industry.[more]