The Dr. Schenk I-V Curve Tracer is the ideal solution for high-speed, non-destructive measurement of I-V curves of thin-film modules prior to the lamination step. It can evaluate the electrical characteristics of every individual cell on the complete thinfilm panel and detect local variations. more

This stand-alone measurement solution test the electrical insulation between the solar cells after scribing. The system detects shorts and minimum resistance between neighboring cells. more

Based on a high resolution matrix camera the Microscope Station has been developed as measurement solution focusing on the width and distance between scribe lines. more

Dr. Schenk's Haze or Light Trapping Monitoring option has been developed in order to check the layer structure of incoming TCO coated glass. more

This add-on option to thin film module inspection measures the sheet resistance of the solar panel's substrate coating. more

With this innovative option PV manufacturers can monitor local thickness variations after layer deposition steps covering the entire panel area. It supports the control of the coating process. more

As measurement update for SolarInspect this system measures length, width and right angularity of the glass panels at the beginning of the production line. more