• Using same hardware set-up as defect analysis
• Layer thickness monitoring and inspection run parallel
• Enhanced technology to process the optical signals
• Real time 2D visualization map (see image)

As the thickness monitoring requires high-resolution, low noise cameras and high performance LED illumination units operating at selective wavelengths this measurement option is best planned to be integrated into the inspection system at an early stage. The costs for a second hardware set can, thus, be saved and the solar panel inspection system becomes a true all-around solution.

For layer thickness measurement, as for e.g. in-line spot test or in off-line laboratory situations, Dr. Schenk alternatively offers a technology using a white light spectrometer. 

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