Microscope Station for Perfect Scribe Analysis

For an optimized cell performance the width and distance between scribe lines is cruicial. Whereas a too thin scribe line might lead to short or bridge circuits a distance deviation can, in the worst case, lead to crossing of the lines.

Based on a high resolution matrix camera the Dr. Schenk Microscope Station has been developed as measurement solution with focus on this challenge. It is therefore the perfect enhancement to a surface inspection system.

Performed Measurements:

  • Width of scribe line Px
  • Distance of scribe line Px to Py

Key Advantages

  • Highest pixel resolution of the matrix camera (< 3 µm)
  • Autofocus function to compensate panel warpage
  • Up to 20 images per panel
  • Optimized illumination unit for reliable images
  • Images taken with no interruption of the panel movement
  • Ideal combination with SolarInspect
  • Also available as Stand-Alone-System

The Microscope Station enables timely reaction on deviations of the scribing process and by this helps to rise yield and optimize the production process.

Dr. Schenk Metrology System

OPV is one of the most promising future technologies in the PV industry.[more]

Look for the Schenk booth at conferences and trade shows 2012

Dr. Schenk is happy to welcome you to conferences and trade shows all around the world. Talk to the...[more]


Dr. Schenk Metrology System

OPV is one of the most promising future technologies in the PV industry.[more]