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Textile Inspection

EasyInspect for textile inspection is a complete solution for the detection of defects in textile fabrics. It examines 100% of the textile surface for local defects.

EasyMeasure continuously monitors the complete material width for a low variation coefficient of the production as regards important properties of textile fabrics, such as material homogeneity, permeability, and coating thickness.

 

Textile inspection
Textile inspection

Typical inspection tasks in textile production include:

  • Contamination detection (oil stains, particles, foreign fibers)
  • Wrinkle detection
  • Streak detection (double picks, reed or hook marks)
  • Hole by fiber breaks  detection (for example torn meshes)
  • Deviations from the base structure (warps, mesh geometry, lattice image etc.)
  • Faulty coating detection  (irregular, non-adhesive or missing)
  • ... and many more

EasyInspect & EasyMeasure for textile inspection use Dr. Schenk’s unique MIDA Technology to inspect textile fabrics with multiple optical channels on a single scan line. One defect generates multiple images to deliver the most comprehensive material analysis on the market.

 

Wrinkle in textile
Wrinkle
Lost fiber in textile web
Lost fiber
Oil stain on textile web
Oil stain
Displaced fibers in textile web
Displaced fibers
Histogram evaluation for textile inspection
Histogram evaluation for textile inspection

Textile materials

Dr. Schenk’s solutions are used in multiple applications and markets, for example in:

  • Gauze inspection
  • Knitted fabrics inspection
  • Braidings inspection
  • Sewed braidings inspection
  • Tubular fabrics inspection
  • Laminated/coated fabrics inspection
  • Carpet inspection
  • Semi-finished textiles inspection
  • … and many more!

Dr. Schenk’s unique histogram evaluation helps to distinguish clearly between regular brightness variations and variations caused by material defects.


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3-Day AOI training course at Dr. Schenk HQ in Martinsried, Germany

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wrinkles in film

Dr. Schenk's "Multiplex Technology" is the basis for MIDA - Multiple Image Defect Analysis. One...[more]