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Particle Inspection

申克博士针对不同的检测需求和材料提供多样的微尘颗粒物检测.

申克博士的微尘颗粒物检测解决方案广泛用于各种应用和工业，如平板显示器玻璃检测和移动显示器玻璃检测和半导体或其他

颗粒物 0.3 µm
颗粒物 0.3 µm
颗粒物1 µm
颗粒物 1 µm
颗粒物 3 µm
颗粒物 3 µm
颗粒物 5 µm
颗粒物 5 µm

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The new-generation Valmet IQ Web Inspection System
Valmet launched a new-generation web inspection system at PaperCon 2019

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3-Day AOI training course at Dr. Schenk in Germany
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