Dr. Schenk GmbH

Bare Glass and Metallized Glass Particle Inspection

Bare Glass and Metallized Glass Particle Inspection
Bare Glass and Metallized Glass Particle Inspection

Dr. Schenk ParticleInspect for glass is designed for highspeed particle detection of bare glass and metallized glass with layer films like ITO, GIN, Cu, A-Si and Mo. It is avialable as a stand-alone version for offline laboratory applications and as an integrated inline production system.

Dr. Schenk ParticleInspect provides high-resolution scanning for smallest particles, such as:

  • dust
  • hair
  • fibers
  • adhered glass chips

This ensures that sources of contamination on glass sheets can be identified and addressed quickly before large production losses occur.

ParticleInspect can differentiate clearly between A-side and B-side particles, an exclusive benefit of the Dr. Schenk inspection. The modular system design enables delivery of complete AOI solutions either as stand-alone components or as customized modules for easy integration into existing production lines.

Particles 0.3 µm
Particles 0.3 µm
Particles 1 µm
Particles 1 µm
Particles 3 µm
Particles 3 µm
Particles 5 µm
Particles 5 µm

>> Download brochures here

Dr. Schenk trade show booth

Come and see us at these events in 2018![more]


Ultra-fast Dr. Schenk TDI cameras as used in the Clean4Yield project

Dr. Schenk is one of the 15 partners in this prestigious project[more]


Dr. Schenk’s Sirius Light Technology delivers more light to the material surface than other...[more]